Supplier : ABB
First maintenance-free FT-IR analyzer
Easy to use, the MB3000 provides constant analysis results for years to come. It offers reliability and constant results in order to address the concerns of lab users. The MB3000 is the result of over 40 years of experience in the aerospace, academic, chemical, pharmaceutical and petrochemical industries. It is the successor to the FTLA2000 spectrometer, also developed by Dr. Buijs and marketed by Bomem inc. since 1985.
With a vertical, space-efficient design, the MB3000 optimizes laboratory workspace and facilitates access to internal components.
The MB3000 contains fixed components that do not wear out with use, meaning no components to replace or adjust. With the MB3000, the HeNe LASER is replaced by a solid state laser.
All optics are non-hygroscopic. Purging is not required for protection of optics.
To maximize reliability, the source is operated so as to provide a 10-year expected lifetime.
Versatility at a glance
The arid-zone open sample compartment of the MB3000 addresses all the needs of the modern analytical laboratory. It can hold a wide variety of easily swappable ABB or third-party accessories that do not require alignment. The instrument can also be purged if needed.
Spectroscopic performance (typical at 25°C with DTGS detector)
- Spectral range 485 to 8,500 cm-1
- Resolution better than 0.7 cm-1
- Apodized resolution adjustable 1 to 64 cm-1, in increments of 2
- Maximum signal-to-noise ratio (root-mean-square, 60s, 4 cm-1, at peak response): 50,000: 1
- Signal sampling: 24-bit ADC
- Short-term stability: < 0.09 %
- Temperature stability: < 1 % per C˚
- Frequency repeatability (@ 1918 cm-1): < 0.001 cm-1
- Frequency accuracy (@ 1918 cm-1): < 0.06 cm-1
Multiple sampling options.
ABB offers the MIRacle™, a universal ATR sampling kit to analyze solids, liquids, pastes, gels and intractable materials addressing the most common sampling needs. Other sampling options offered by ABB include a horizontal ATR kit, demountable liquid cells, a diffuse reflectance DRIFT accessory, gas cells, specular reflectance accessories with fixed and variable angles, and micro-sampling with a beam condenser or microscope.
The simple in-sample-compartment microscope permits convenient viewing of the sample. The microscope uses the un cooled detector of the MB3000 and is suitable for analysis of sample areas as small as 100 micrometers.